KD-5100+
High-reliability differential displacement measurement system with nanometer resolution
- Upgraded, higher-reliability version of the KD-5100 using the identical proprietary hybrid microcircuit
- Upgrades to circuit layout, ground connections, and sensor connectors
- Higher-reliability diodes and capacitors
- Manufactured to MIL-PRF-38534 Class H
- MTBF exceeding 238,000 hours (space flight) and 55,000 hours (tactical)
- Small package size: 2 × 2.12 × 0.75 inches — ideal for SWaP-C
- Nanometer resolution
Specifications
| Resolution | To a nanometer (differential) |
|---|---|
| Output | ±10 Vdc maximum |
| Package size | 2 × 2.12 × 0.75 inches |
| Qualification | MIL-PRF-38534 Class H |
| Reliability | MTBF >238,000 hours (space flight); 55,000 hours (tactical) |
Sensors
| Sensor | Target Material | Static Resolution |
|---|---|---|
| 15N | Aluminum — smooth body, 0.188 in dia (0.172 in for -004) | Up to ±0.035 in (±0.9 mm) |
| 20N | Aluminum — 0.4 in dia base mount | Up to ±0.075 in (±1.9 mm) |
Certifications
Manufactured to MIL-PRF-38534 Class H with MIL-SPEC components used throughout the electronics.
Options
Accessories
Matched sensor pairs, cables, and mounting hardware are available. Contact an applications engineer for configuration.
Frequently Asked Questions
How does the KD-5100+ differ from the KD-5100?
It is an upgraded, higher-reliability build on the identical hybrid microcircuit — with improved circuit layout, ground connections, sensor connectors, and higher-reliability diodes and capacitors, qualified to MIL-PRF-38534 Class H.
What applications suit the KD-5100+?
Laser communications satellites and ground stations, image stabilization, and directed energy systems for ground, shipboard, and airborne use — anywhere SWaP-C and high reliability are critical.
What is the reliability rating?
Mean time between failures exceeds 238,000 hours in a space-flight environment and 55,000 hours in a tactical environment.
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